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<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-GB style='font-size:12.0pt;font-family:"Times New Roman","serif"'>-------------------------------------------------------------------------------------------------------------------------------<o:p></o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-GB style='font-size:12.0pt;font-family:"Times New Roman","serif"'><o:p> </o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-GB style='font-size:12.0pt;font-family:"Times New Roman","serif"'>(Apologies
for cross-posting.)<o:p></o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-GB style='font-size:12.0pt;font-family:"Times New Roman","serif"'><o:p> </o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-GB style='font-size:12.0pt;font-family:"Times New Roman","serif"'>EURASIP
Journal on Advances in Signal Processing<o:p></o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'>Special
issue on Signal Processing in Advanced Nondestructive Materials Inspection<o:p></o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'><a
href="http://www.hindawi.com/journals/asp/si/ndt.html">http://www.hindawi.com/journals/asp/si/ndt.html</a><o:p></o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'>Announce
and Call for papers<o:p></o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'><o:p> </o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-GB style='font-size:12.0pt;font-family:"Times New Roman","serif"'>We
would appreciate if you could distribute this information by your colleagues
and co-workers.<o:p></o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-GB style='font-size:12.0pt;font-family:"Times New Roman","serif"'><o:p> </o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-GB style='font-size:12.0pt;font-family:"Times New Roman","serif"'>-------------------------------------------------------------------------------------------------------------------------------<o:p></o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'><o:p> </o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'>Dear
Colleague,<o:p></o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'><o:p> </o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'>Nowadays,
techniques of nondestructive testing (NDT) have evolved greatly due to recent
advances in microelectronics and signal processing and analysis. For example,
many image processing and analysis techniques can now be readily applied at
standard video rates using commercially available hardware, in particular, to
methods that generate TV-type image sequences, such as real-time radiography,
pulse-video thermography, ultrasonic-phased array, laser ultrasonics, and
shearography.<o:p></o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'><o:p> </o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'>The
main objective of this special issue on “Signal processing in nondestructive
materials inspection” (<a
href="http://www.hindawi.com/journals/asp/si/ndt.html">http://www.hindawi.com/journals/asp/si/ndt.html</a>)
of the </span><span lang=EN-GB style='font-size:12.0pt;font-family:"Times New Roman","serif"'>EURASIP
Journal on Advances in Signal Processing (<a
href="http://www.hindawi.com/journals/asp/">http://www.hindawi.com/journals/asp/</a>)
</span><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'>is
to promote a comprehensive forum for discussion on the recent advances in
signal processing techniques applied to nondestructive material inspection.<o:p></o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'><o:p> </o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'><o:p> </o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'>Topics
of interest include (not limited to):<o:p></o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'><o:p> </o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'>-
Signal processing and analysis in advanced NDT;<o:p></o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'>-
Image processing and analysis in advanced NDT;<o:p></o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'>-
Materials characterization using advanced NDT;<o:p></o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'>-
Defect detection and characterization using advanced NDT;<o:p></o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'>-
Pattern recognition and classification for advanced NDT;<o:p></o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'>-
3D image reconstruction from advanced NDT data;<o:p></o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'>-
Applications of advanced NDT;<o:p></o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'>-
Algorithms development for signal processing and analysis in advanced NDT;<o:p></o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'>-
Software development for defect detection and characterization in NDT images.<o:p></o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'><o:p> </o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'><o:p> </o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'>Submission
Instructions:<o:p></o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'><o:p> </o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'>Before
submission authors should carefully read over the journal's Author Guidelines,
which are located at <a
href="http://www.hindawi.com/journals/asp/guidelines.html">http://www.hindawi.com/journals/asp/guidelines.html</a>.<o:p></o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'>Prospective
authors should submit an electronic copy of their complete manuscript through
the journal Manuscript Tracking System at <a href="http://mts.hindawi.com/">http://mts.hindawi.com/</a>
according to the following timetable:<o:p></o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'><o:p> </o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'>Manuscript
Due: January 1, 2010;<o:p></o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'>First
Round of Reviews: April 1, 2010;<o:p></o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'>Publication
Date: July 1, 2010.<o:p></o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'><o:p> </o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'>Best
regards, <o:p></o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'><o:p> </o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'>Joćo
Manuel R. S. Tavares, Department of Mechanical Engineering, Faculty of
Engineering, University of Porto, Portugal (<a href="mailto:tavares@fe.up.pt">tavares@fe.up.pt</a>)<o:p></o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'>(Lead
Guest Editor)<o:p></o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'><o:p> </o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'>Joćo
Marcos A. Rebello, Department of Metallurgy and Materials, Technological
Center, Faculty of Engineering, Federal University of Rio de Janeiro, Brazil (<a
href="mailto:jmarcos@metalmat.ufrj.br">jmarcos@metalmat.ufrj.br</a>)<o:p></o:p></span></p>
<p class=MsoNormal style='margin-bottom:0cm;margin-bottom:.0001pt;line-height:
normal'><span lang=EN-US style='font-size:12.0pt;font-family:"Times New Roman","serif"'>(Guest
Editor)<o:p></o:p></span></p>
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